GE X-ray diffraction detector

GE Sensing & Inspection Technologies announces Meteor1D for X-ray diffraction detecting. The Meteor1D features a 64 mm window and can be operated as both a point and a linear detector. It can be used for a wide range of applications including phase analysis and determination of retained austenite, kinetic experiments, involving in-situ phase transformations and residual stress, texture and thin film analysis. The Meteor1D uses the single photon counting principle and incorporates semiconductor technology. Meteor1D is a maintenance-free detector, which does not require gas or even the minimum of cooling. No Beryllium is employed and the detector complies with the most stringent health and safety regulations. The Meteor1D can be easily retrofitted into existing Seifert XRD3000 and XRD3003 diffractometers. For more information visit www.gesensinginspection.com.

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